YURCHENKO, V.; NAVRUZ, T. S.; CIYDEM, M.; ALTINTAS, A. Microwave Whispering-Gallery-Mode Photoconductivity Measurement of Recombination Lifetime in Silicon. Advanced Electromagnetics, [S. l.], v. 8, n. 2, p. 101–107, 2019. DOI: 10.7716/aem.v8i2.1127. Disponível em: https://aemjournal.org/index.php/AEM/article/view/1127. Acesso em: 14 dec. 2025.