ROSSIGNOL, J.; STUERGA, D.; BAILLY, G.; HARRABI, A.; GIRARD, S.; LALLÉCHÈRE, S. Microwave microscopy applied to EMC problem: Visualisation of electromagnetic field in the vicinity of electronic circuit and effect of nanomaterial coating. Advanced Electromagnetics, [S. l.], v. 6, n. 2, p. 33–39, 2017. DOI: 10.7716/aem.v6i2.429. Disponível em: https://aemjournal.org/index.php/AEM/article/view/429. Acesso em: 14 nov. 2025.