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This paper deals with the advanced integration of uncertainties in electromagnetic interferences (EMI) and electromagnetic compatibility (EMC) problems. In this context, the Monte Carlo formalism may provide a reliable reference to proceed to statistical assessments. After all, other less expensive and efﬁcient techniques have been implemented more recently (the unscented transform and stochastic collocation methods for instance) and will be illustrated through uncertain EMC problems. Finally, we will present how the use of sensitivity analysis techniques may offer an efﬁcient complement to rough statistical or stochastic studies.
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