Microwave microscopy applied to EMC problem: Visualisation of electromagnetic field in the vicinity of electronic circuit and effect of nanomaterial coating

Main Article Content

J. Rossignol D. Stuerga G. Bailly A. Harrabi S. Girard S. Lalléchère


This proposal is devoted to a collaborative approach dealing with microwave microscopy experiments. The application is dedicated to an electromagnetic field cartography above circuits and the influence of nanometric material layer deposition on the circuits. The first application is associated to a microstrip ring resonator. The results match with the simulated fields. The second application is focused on the effects of a dielectric layer deposited on the circuit and its impact in terms of electromagnetic propagation.

| Abstract  : 159 | PDF  : 152 |

Download Statistics


Download data is not yet available.

Article Details

How to Cite
Rossignol, J., Stuerga, D., Bailly, G., Harrabi, A., Girard, S., & Lalléchère, S. (2017, May 20). Microwave microscopy applied to EMC problem: Visualisation of electromagnetic field in the vicinity of electronic circuit and effect of nanomaterial coating. Advanced Electromagnetics, 6(2), 33-39. https://doi.org/https://doi.org/10.7716/aem.v6i2.429

  1. A. Geetha, K.K.S. Kumar, C.R.K. Rao, M. Vijayan, D.C. Trivedi, "EMI shielding: Methods and materials - A review," Journal of Applied Polymer Science, vol. 112, 2073–2086, 2009.
    View Article

  2. M.T. Ma, M. Kanda, M.L. Crawford, E.B. Larsen, "A review of electromagnetic compatibility/interference measurement methodologies," Proc. of the IEEE, Vol. 73, No. 3, March 1985.
    View Article

  3. Y. Liu, B. Ravelo, J. Ben Hadj Slama, "Calculations of near-field emissions in frequency-domain into timedependent data with arbitrary wave form transient perturbations," Advanced electromagnetics, Vol. 1, No. 2, August 2012.
    View Article

  4. T. Hiraoka, et al. "Electric field distributions in microwave planar circuits by small coaxial probe and comparison with FDTD method." 2005 European Microwave Conference. (2) IEEE, 2005. 

  5. N.V. Kantartzis, T.D. Tsiboukis, "Modern EMC Analysis Techniques Volume I: Time-Domain Computational Schemes,"' Ed. Morgan & Claypool, 2008.

  6. N.V. Kantartzis, T.D. Tsiboukis, "Modern EMC Analysis Techniques Volume II: Models and Applications,"' Ed. Morgan & Claypool, 2008. 

  7. A. Desire, A. Kriga, M. Youssouf, A. Siblini, J-P. Chatelon, M-F. Blanc-Mignon, B. Payet-Gervy, A. Piot, D. Dufeu, J-J. Rousseau, "Fabrication and characterization of micro-inductors deposited on magnetic thin and thick layers,"' Advanced electromagnetics, Vol. 2, No. 3, December 2013.
    View Article

  8. C.R. Paul, "Introduction to Electromagnetic Compatibility,"' John Wiley & Sons Inc., Second edition, New York, 2006. P. Besnier, B. D’emoulin, "Electromagnetic Reverberation Chambers,"' Ed. Wiley-ISTE, 2011. 

  9. P. Besnier, B. D´emoulin, “Electromagnetic Reverberation Chambers,”’ Ed. Wiley-ISTE, 2011.

  10. X. Dong, S. Deng, T. Hubing, D. Beetner, "Analysis of chip-level EMI using near-field magnetic scanning," 2004 Int. Symp. on EMC, Vol. 1, pp. 174-177, August 2004.
    View Article

  11. J. Fan, "Near-Field Scanning for EM Emission Characterization", IEEE Electromagnetic Compatibility Magazine, Vol. 4(3), 2015.

  12. S.O. Land, O. Tereshchenko, M. Ramdani, F. Leferink, R. Perdirau, "Printed Circuit Board Permittivity Measurement Using Waveguide and Resonator Rings," Proceedings of EMC'14, Tokyo, Japan, 777– 780, 2014.

  13. D.S. Dixon, J. Masi, "Thin Coatings Can Provide Significant Shielding Against Low Frequency EMF Magnetic Fields," Proceedings of IEEE International Symposium on EMC, Denver, USA, 1035–1040, Aug. 1998.
    View Article

  14. J. Rossignol, C. Plassard, E. Bourilot, O. Calonne, M. Foucault, E. Lesnewska, "Non-destructive technique to detect local buried defects in metal sample by scanning microwave microscope," Physical Review B, 83, 121409(R), 2011.

  15. G. Yingjie, I. Wolff. "A simple electric near field probe for microwave circuit diagnostics," IEEE MTTS International. (3). IEEE, 1996.

  16. C. Valdman, M.H.C. Dias, and J.C.A. dos Santos, J. C. A. . "Design and calibration of electric field probe to the frequency range of 2 to 3 GHz." IEEE Latin America Transactions, 6(7), pp. 557-564, 2008.
    View Article

  17. Y. Wu, F. J. Rosenbaum. " Mode chart for microstrip ring resonators (Short Papers)." IEEE Transactions on Microwave Theory and Techniques (21.7), pp. 487- 489, 1973.

  18. T. Ohno, K. Sarukawa, K. Tokieda, M. Matsumura, "Morphology of a TiO2 photocatalyst (Degussa, P-25) consisting of anatase and rutile crystalline phases," Journal of Catalysis, 203(1), pp. 82-86, 2001.
    View Article

  19. O. Bunsho, et al. "What is Degussa (Evonik) P25? Crystalline composition analysis, reconstruction from isolated pure particles and photocatalytic activity test." Journal of Photochemistry and Photobiology A: Chemistry 216(2), pp. 179-182, 2010.

  20. U. Diebold, "The surface science of titanium dioxyde," Surface Science Report, 48(5), 53-229, 2003.
    View Article

  21. G. Bailly, A. Harrabi, J. Rossignol, et al.,"Microwave gas sensing with a Microstrip InterDigital Capacitor: detection of NH 3 with TiO2 nanoparticles," Sensors and Actuators B: Chemical, 2016.
    View Article

  22. G. Bailly, J. Rossignol, B. De Fonseca, et al, "Microwave gas sensing with hematite: shape effect on ammonia detection using pseudocubic, rhombohedral and spindle-like particles," ACS Sensors, 2016.